Document Details

Document Type : Article In Journal 
Document Title :
SIMS Analysis Study of the All Nb SIS Junction
SIMS دراسة تحليلية لموصل كهربائي بواسطة جهاز
 
Subject : Physics 
Document Language : English 
Abstract : This work presents an experimental investigation of SIS junctions when a thin insulator layer (AlOx) is introduced between the two superconductor electrodes. The SIMS analysis technique showed the diffusivity effect of the AlOx as barrier onto the top electrode. The experimental results determine the effect of the AlOx on the device performances. A general explanation and discussion of this effect has been presented. 
ISSN : 1012-1319 
Journal Name : Science Journal 
Volume : 13 
Issue Number : 1 
Publishing Year : 1421 AH
2001 AD 
Number Of Pages : 11 
Article Type : Article 
Added Date : Sunday, October 11, 2009 

Researchers

Researcher Name (Arabic)Researcher Name (English)Researcher TypeDr GradeEmail
فهد مسعود المرزوقيFAHAD AL-MARZOUKIResearcher  

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