Document Details

Document Type : Article In Conference 
Document Title :
EBIC Contrast of Extended Defects: Theory, Experiment and Monte Carlo Simulations
تباين العيوب الممتدة الناتج عن التيار المحرض بحزمة الكترونية النظرية و التجربة و المحاكاة العددية
 
Subject : chemistry and geochemistry 
Document Language : Arabic 
Abstract : ABSTRACT. The Electron Beam Induced Current (EBIC) technique has been widely used to image the recombination activity of various extended defects including dislocations and grain bonndarics in semiconductors. In this paper, we deserioc a Moute Carlo algorithm thai we have developed 10 simulate the EBIC eontrast at a defect of arbitrary shape loeated underneath the Schottky contact. Then we discuss the results that wc have obtained for a dislocation perpcndieular to the surface. 
Conference Name : the second saudi science confernce 
Duration : From : 24محرم AH - To : 26محرم AH
From : 15مارس AD - To : 17مارس AD 
Publishing Year : 1425 AH
2004 AD 
Number Of Pages : 8 
Article Type : Article 
Added Date : Saturday, January 17, 2009 

Researchers

Researcher Name (Arabic)Researcher Name (English)Researcher TypeDr GradeEmail
محمد لضرعLEDRA, N/A Investigator  
نوار ثابتTABET, N/A Researcher natabet@kfupm.edu.sa

Files

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